文献
J-GLOBAL ID:201702296565446161
整理番号:17A1258072
高電圧UMOSのホットキャリア信頼性のための設計【Powered by NICT】
Design for hot-carrier reliability of HV UMOS
著者 (8件):
Aryadeep Chirag
(Department of Computer Science and Information Engineering, Asia University, 500, Lioufeng Rd., Taichung, Taiwan-41354)
,
Sheu Gene
(Department of Computer Science and Information Engineering, Asia University, 500, Lioufeng Rd., Taichung, Taiwan-41354)
,
Selvendran Sivaji
(Department of Computer Science and Information Engineering, Asia University, 500, Lioufeng Rd., Taichung, Taiwan-41354)
,
Jaiswal Suman
(Department of Computer Science and Information Engineering, Asia University, 500, Lioufeng Rd., Taichung, Taiwan-41354)
,
Krishna Sai S.
(Department of Computer Science and Information Engineering, Asia University, 500, Lioufeng Rd., Taichung, Taiwan-41354)
,
Mastanbasheer Shaik
(Department of Computer Science and Information Engineering, Asia University, 500, Lioufeng Rd., Taichung, Taiwan-41354)
,
Sai Dheeraj Muntha
(Department of Computer Science and Information Engineering, Asia University, 500, Lioufeng Rd., Taichung, Taiwan-41354)
,
Chen Po-An
(Nuvoton Technology Corporation, Hsinchu, Taiwan)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
ISNE
ページ:
1-3
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)