文献
J-GLOBAL ID:201802210806066614
整理番号:18A0910886
トンネル電界効果トランジスタの短チャネル効果シミュレーション
Simulation study of short-channel effects of tunnel field-effect transistors
著者 (11件):
FUKUDA Koichi
(National Inst. of Advance Industrial Sci. and Technol., Ibaraki, JPN)
,
ASAI Hidehiro
(National Inst. of Advance Industrial Sci. and Technol., Ibaraki, JPN)
,
HATTORI Junichi
(National Inst. of Advance Industrial Sci. and Technol., Ibaraki, JPN)
,
MORI Takahiro
(National Inst. of Advance Industrial Sci. and Technol., Ibaraki, JPN)
,
MORITA Yukinori
(National Inst. of Advance Industrial Sci. and Technol., Ibaraki, JPN)
,
MIZUBAYASHI Wataru
(National Inst. of Advance Industrial Sci. and Technol., Ibaraki, JPN)
,
MASAHARA Meishoku
(National Inst. of Advance Industrial Sci. and Technol., Ibaraki, JPN)
,
MIGITA Shinji
(National Inst. of Advance Industrial Sci. and Technol., Ibaraki, JPN)
,
OTA Hiroyuki
(National Inst. of Advance Industrial Sci. and Technol., Ibaraki, JPN)
,
ENDO Kazuhiro
(National Inst. of Advance Industrial Sci. and Technol., Ibaraki, JPN)
,
MATSUKAWA Takashi
(National Inst. of Advance Industrial Sci. and Technol., Ibaraki, JPN)
資料名:
Japanese Journal of Applied Physics
(Japanese Journal of Applied Physics)
巻:
57
号:
4S
ページ:
04FD04.1-04FD04.4
発行年:
2018年04月
JST資料番号:
G0520B
ISSN:
0021-4922
CODEN:
JJAPB6
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)