文献
J-GLOBAL ID:201802217151956191
整理番号:18A0525033
血液脳関門(BBB)-皮質内シリコン微小電極インプラントの破壊【Powered by NICT】
Blood brain barrier (BBB)-disruption in intracortical silicon microelectrode implants
著者 (7件):
Bennett Cassie
(Department of Biomedical Engineering, University of Miami, FL, USA)
,
Samikkannu Malaroviyam
(Department of Biomedical Engineering, University of Miami, FL, USA)
,
Mohammed Farrah
(Department of Biology, University of Miami, FL, USA)
,
Dietrich W. Dalton
(The Miami Project to Cure Paralysis, University of Miami, FL, USA)
,
Rajguru Suhrud M.
(Department of Biomedical Engineering, University of Miami, FL, USA)
,
Rajguru Suhrud M.
(Department of Otolaryngology, University of Miami, FL, USA)
,
Prasad Abhishek
(Department of Biomedical Engineering, University of Miami, FL, USA)
資料名:
Biomaterials
(Biomaterials)
巻:
164
ページ:
1-10
発行年:
2018年
JST資料番号:
C0964B
ISSN:
0142-9612
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)