文献
J-GLOBAL ID:201802217428411665
整理番号:18A0443016
スマートハイサイド装置のためのフラックスクリーン解の定性的および定量的研究【Powered by NICT】
Qualitative & quantitative study of flux-clean solution for smart high-side device
著者 (5件):
Abarro Ghizelle Jane
(ON Semiconductor Philippines Inc., Golden Mile Business Park - SEZ Governor’s Drive, Carmona, Cavite 4116 Philippines)
,
Aguinaldo Victor
(ON Semiconductor Philippines Inc., Golden Mile Business Park - SEZ Governor’s Drive, Carmona, Cavite 4116 Philippines)
,
Ceasar-Paule Alex
(ON Semiconductor Philippines Inc., Golden Mile Business Park - SEZ Governor’s Drive, Carmona, Cavite 4116 Philippines)
,
Tan Ariel
(ON Semiconductor Philippines Inc., Golden Mile Business Park - SEZ Governor’s Drive, Carmona, Cavite 4116 Philippines)
,
Ramos Manny
(ON Semiconductor Philippines Inc., Golden Mile Business Park - SEZ Governor’s Drive, Carmona, Cavite 4116 Philippines)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
EPTC
ページ:
1-5
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)