文献
J-GLOBAL ID:201802218434934963
整理番号:18A0588572
シリコン-オン-絶縁体MOSFETにおける界面結合効果に基づいた新しい光検出器【Powered by NICT】
A novel photodetector based on the interface coupling effect in silicon-on-insulator MOSFETs
著者 (8件):
Deng J. N.
(State key lab of ASICs and Systems, School of Information Science and Engineering, Fudan University, Shanghai, China)
,
Shao J. H.
(State key lab of ASICs and Systems, School of Information Science and Engineering, Fudan University, Shanghai, China)
,
Lu B. R.
(State key lab of ASICs and Systems, School of Information Science and Engineering, Fudan University, Shanghai, China)
,
Chen Y. F.
(State key lab of ASICs and Systems, School of Information Science and Engineering, Fudan University, Shanghai, China)
,
Zaslavsky A.
(Department of Physics and School of Engineering, Brown University, Providence, RI 02912, USA)
,
Cristoloveanu S.
(IMEP-LAHC, INP-Grenoble/Minatec, BP257, Grenoble 38016, France)
,
Bawedin M.
(IMEP-LAHC, INP-Grenoble/Minatec, BP257, Grenoble 38016, France)
,
Wan J.
(State key lab of ASICs and Systems, School of Information Science and Engineering, Fudan University, Shanghai, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
S3S
ページ:
1-3
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)