文献
J-GLOBAL ID:201802219646833590
整理番号:18A0943913
真の任意の非線形性較正技術を用いた1.2psジッタ完全合成可能完全較正分数N注入同期PLL【JST・京大機械翻訳】
A 1.2ps-jitter fully-synthesizable fully-calibrated fractional-N injection-locked PLL using true arbitrary nonlinearity calibration technique
著者 (15件):
Liu Bangan
(Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2-12-1-S3-27, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan)
,
Ngo Huy Cu
(Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2-12-1-S3-27, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan)
,
Nakata Kengo
(Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2-12-1-S3-27, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan)
,
Deng Wei
(Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2-12-1-S3-27, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan)
,
Zhang Yuncheng
(Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2-12-1-S3-27, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan)
,
Qiu Junjun
(Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2-12-1-S3-27, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan)
,
Yoshioka Torn
(Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2-12-1-S3-27, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan)
,
Emmei Jun
(Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2-12-1-S3-27, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan)
,
Zhang Haosheng
(Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2-12-1-S3-27, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan)
,
Pang Jian
(Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2-12-1-S3-27, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan)
,
Narayanan Aravind Tharayil
(Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2-12-1-S3-27, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan)
,
Yang Dongsheng
(Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2-12-1-S3-27, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan)
,
Liu Hanli
(Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2-12-1-S3-27, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan)
,
Okada Kenichi
(Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2-12-1-S3-27, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan)
,
Matsuzawa Akira
(Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, 2-12-1-S3-27, Ookayama, Meguro-ku, Tokyo, 152-8552, Japan)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2018
号:
CICC
ページ:
1-4
発行年:
2018年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)