文献
J-GLOBAL ID:201802222445565416
整理番号:18A2034583
非対称GaAs/AlGaAsステップ多重量子井戸を用いた広帯域バイアス調整可能テラヘルツ光検出器【JST・京大機械翻訳】
Broadband bias-tunable terahertz photodetector using asymmetric GaAs/AlGaAs step multi-quantum well
著者 (8件):
Wang H. X.
(Key Laboratory of Terahertz Solid-State Technology, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Changning Road, Shanghai 200050, People’s Republic of China)
,
Fu Z. L.
(Key Laboratory of Terahertz Solid-State Technology, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Changning Road, Shanghai 200050, People’s Republic of China)
,
Shao D. X.
(Shanghai Key Lab of Modern Optical Systems, Terahertz Technology Innovation Research Institute, and Engineering Research Center of Optical Instrument and System, Ministry of Education, University of Shanghai for Science and Technology, 516 Jungong Road, Shanghai 200093, People’s Republic ...)
,
Zhang Z. Z.
(Key Laboratory of Terahertz Solid-State Technology, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Changning Road, Shanghai 200050, People’s Republic of China)
,
Wang C.
(Key Laboratory of Terahertz Solid-State Technology, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Changning Road, Shanghai 200050, People’s Republic of China)
,
Tan Z. Y.
(Key Laboratory of Terahertz Solid-State Technology, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Changning Road, Shanghai 200050, People’s Republic of China)
,
Guo X. G.
(Shanghai Key Lab of Modern Optical Systems, Terahertz Technology Innovation Research Institute, and Engineering Research Center of Optical Instrument and System, Ministry of Education, University of Shanghai for Science and Technology, 516 Jungong Road, Shanghai 200093, People’s Republic ...)
,
Cao J. C.
(Key Laboratory of Terahertz Solid-State Technology, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Changning Road, Shanghai 200050, People’s Republic of China)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
113
号:
17
ページ:
171107-171107-4
発行年:
2018年
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)