文献
J-GLOBAL ID:201802224878346109
整理番号:18A0969203
熱電特性測定に基づく電気伝導率比によるキャリア散乱係数を解析するための機構と応用法【JST・京大機械翻訳】
Mechanism and application method to analyze the carrier scattering factor by electrical conductivity ratio based on thermoelectric property measurement
著者 (7件):
Xu Guiying
(Beijing Municipal Key Laboratory of Advanced Energy Materials and Technology, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083, China)
,
Ren Pan
(Beijing Municipal Key Laboratory of Advanced Energy Materials and Technology, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083, China)
,
Lin Tie
(National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics of the Chinese Academy of Science, Shanghai 200083, China)
,
Wu Xiaofeng
(Beijing Municipal Key Laboratory of Advanced Energy Materials and Technology, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083, China)
,
Zhang Yanhua
(Beijing Municipal Key Laboratory of Advanced Energy Materials and Technology, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083, China)
,
Niu Sitong
(Beijing Municipal Key Laboratory of Advanced Energy Materials and Technology, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083, China)
,
Bailey Trevor P.
(Department of Physics, University of Michigan, Ann Arbor, Michigan 48109, USA)
資料名:
Journal of Applied Physics
(Journal of Applied Physics)
巻:
123
号:
1
ページ:
015101-015101-9
発行年:
2018年
JST資料番号:
C0266A
ISSN:
0021-8979
CODEN:
JAPIAU
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)