文献
J-GLOBAL ID:201802227593906835
整理番号:18A0846568
一貫性試験システムの全体設計スキームに関する研究【JST・京大機械翻訳】
Research on the overall design scheme of consistency test system
著者 (7件):
Chen Songsong
(China Electric Power Research Institute, Beijing, China)
,
Li Dezhi
(China Electric Power Research Institute, Beijing, China)
,
Dong Mingyu
(China Electric Power Research Institute, Beijing, China)
,
Yang Bin
(State Grid Jiangsu Electric Power Company, Nanjing, China)
,
Liu Changli
(School of Electric and Electronic Engineering, North China Electric Power University (NCEPU), Beijing, China)
,
Sun Yi
(School of Electric and Electronic Engineering, North China Electric Power University (NCEPU), Beijing, China)
,
Li Bin
(School of Electric and Electronic Engineering, North China Electric Power University (NCEPU), Beijing, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
ICCSNT
ページ:
170-174
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)