文献
J-GLOBAL ID:201802228056876222
整理番号:18A1941269
圧電応答力顕微鏡におけるプローブチップの有効点電荷【JST・京大機械翻訳】
The effective point charge of probe tip in piezoresponse force microscopy
著者 (5件):
Ming W. J.
(Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education, School of Materials Science and Engineering, Xiangtan University, Hunan 411105, China)
,
Zhu R. K.
(Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education, School of Materials Science and Engineering, Xiangtan University, Hunan 411105, China)
,
Pan K.
(Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education, School of Materials Science and Engineering, Xiangtan University, Hunan 411105, China)
,
Liu Y. Y.
(Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education, School of Materials Science and Engineering, Xiangtan University, Hunan 411105, China)
,
Lei C. H.
(Department of Aerospace and Mechanical Engineering, Saint Louis University, St. Louis, Missouri 6310-1110, USA)
資料名:
Journal of Applied Physics
(Journal of Applied Physics)
巻:
124
号:
15
ページ:
154106-154106-11
発行年:
2018年
JST資料番号:
C0266A
ISSN:
0021-8979
CODEN:
JAPIAU
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)