文献
J-GLOBAL ID:201802234486181750
整理番号:18A0588721
RF MEMS不均一試験放射線技術のイミュニティ試験【Powered by NICT】
Immunity test of RF MEMS of non uniform test radiation techniques
著者 (4件):
Jmai Bassem
(Department of Physics, High Frequencies Electronics Circuit and System Research Unit, FST, University Tunis El Manar, Tunis, Tunisia)
,
Mendes Paulo
(Department of Industrial Electronics, Microelectromechanical Systems Research Center, University of Minho, Guimaraes, Portugal)
,
Rajhi Adnen
(Laboratory of physics Soft materials & EM modelisation, FST, University Tunis El Manar, Tunis, Tunisia)
,
Gharsallah Ali
(Department of Physics, FST, Unit of Research in High Frequency Electronic Circuit and System, University Tunis El Manar, Tunis, Tunisia)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
STA
ページ:
115-119
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)