文献
J-GLOBAL ID:201802235460798481
整理番号:18A1679513
FBGA28nm走査チェーン故障解析【JST・京大機械翻訳】
FBGA 28nm Scan Chain Failure Analysis
著者 (6件):
Ning Liew Chiun
(Intel Programmable Solution Group (PSG)., Plot 6, Bayan Lepas Technoplex, Medan Bayan Lepas, Penang, 11900, Malaysia)
,
Heng Lau Kok
(Intel Programmable Solution Group (PSG)., Plot 6, Bayan Lepas Technoplex, Medan Bayan Lepas, Penang, 11900, Malaysia)
,
Jie Ng Yi
(Intel Programmable Solution Group (PSG)., Plot 6, Bayan Lepas Technoplex, Medan Bayan Lepas, Penang, 11900, Malaysia)
,
Lay Goh Lay
(Intel Programmable Solution Group (PSG)., Plot 6, Bayan Lepas Technoplex, Medan Bayan Lepas, Penang, 11900, Malaysia)
,
Haw Lee Chong
(Intel Programmable Solution Group (PSG)., Plot 6, Bayan Lepas Technoplex, Medan Bayan Lepas, Penang, 11900, Malaysia)
,
Wen Loo Huey
(Intel Programmable Solution Group (PSG)., Plot 6, Bayan Lepas Technoplex, Medan Bayan Lepas, Penang, 11900, Malaysia)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2018
号:
IPFA
ページ:
1-3
発行年:
2018年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)