文献
J-GLOBAL ID:201802236180675811
整理番号:18A0188046
マルチインフィードH VDCシステムにおける転流失敗リスクの新しい解釈【Powered by NICT】
A new interpretation of commutation failure risk in multi-infeed HVDC systems
著者 (6件):
Wang Xiaohui
(Key Laboratory of Power System Intelligent Dispatch and Control (Ministry of Education), Shandong University, Jinan, China)
,
Bai Yu
(Key Laboratory of Power System Intelligent Dispatch and Control (Ministry of Education), Shandong University, Jinan, China)
,
Chen Qingjun
(Key Laboratory of Power System Intelligent Dispatch and Control (Ministry of Education), Shandong University, Jinan, China)
,
Gao Yadong
(Zhejiang Huayun Electric Power Engineering Design & Consulting Co. Ltd., Hangzhou, China)
,
Luo Jinshan
(State Power Economic Research Institute, Beijing, China)
,
Zhang Yan
(State Power Economic Research Institute, Beijing, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
EI2
ページ:
1-5
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)