文献
J-GLOBAL ID:201802237617175167
整理番号:18A1942608
CVDグラフェンにおける高精度抵抗量子化の観測【JST・京大機械翻訳】
Observation of High Accuracy Resistance Quantization in CVD Graphene
著者 (6件):
Thodkar Kishan
(Physics Department, University of Basel, Klingelbergstrasse 82, Basel, 4056, Switzerland)
,
Schonenberger Christian
(Physics Department, University of Basel, Klingelbergstrasse 82, Basel, 4056, Switzerland)
,
Calame Michel
(Physics Department, University of Basel, Klingelbergstrasse 82, Basel, 4056, Switzerland)
,
Luond Felix
(Federal Institute of Metrology METAS, Lindenweg 50, Bern, 3003, Switzerland)
,
Overney Frederic
(Federal Institute of Metrology METAS, Lindenweg 50, Bern, 3003, Switzerland)
,
Jcanncret Blaise
(Federal Institute of Metrology METAS, Lindenweg 50, Bern, 3003, Switzerland)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2018
号:
CPEM
ページ:
1-2
発行年:
2018年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)