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J-GLOBAL ID:201802238381416781
整理番号:18A0164357
IGBTの健全性監視と早期故障診断のためのEMRシグネチャ解析【Powered by NICT】
EMR signature analysis for health monitoring and early stage fault diagnosis of IGBT
著者 (5件):
Biswas Rajashree
(Department Of Electrical Engineering, Indian Institute Of Technology Kharagpur, Kharagpur, India)
,
Routray Aurobinda
(Department Of Electrical Engineering, Indian Institute Of Technology Kharagpur, Kharagpur, India)
,
Sengupta Sabyasachi
(Department Of Electrical Engineering, Indian Institute Of Technology Kharagpur, Kharagpur, India)
,
Pramanik Meghabriti
(Advanced Technology, Development Center, Indian Institute Of Technology Kharagpur, Kharagpur, India)
,
Gupta Arvind Kumar
(Advanced Technology, Development Center, Indian Institute Of Technology Kharagpur, India)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
IECON
ページ:
5043-5048
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)