文献
J-GLOBAL ID:201802239011737767
整理番号:18A0283717
電子光学切片によるナノメートルスケールの深さ分解能の3D元素マッピング【Powered by NICT】
3D elemental mapping with nanometer scale depth resolution via electron optical sectioning
著者 (12件):
Pennycook Timothy J.
(EPSRC SuperSTEM Facility, Daresbury Laboratory, Warrington WA4 4AD, UK)
,
Pennycook Timothy J.
(Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK)
,
Yang Hao
(Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK)
,
Jones Lewys
(Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK)
,
Cabero Mariona
(Grupo de Fisica de Materiales Complejos, Universidad Complutense, 28040 Madrid, Spain)
,
Rivera-Calzada Alberto
(Grupo de Fisica de Materiales Complejos, Universidad Complutense, 28040 Madrid, Spain)
,
Leon Carlos
(Grupo de Fisica de Materiales Complejos, Universidad Complutense, 28040 Madrid, Spain)
,
Varela Maria
(Grupo de Fisica de Materiales Complejos, Universidad Complutense, 28040 Madrid, Spain)
,
Varela Maria
(Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA)
,
Santamaria Jacobo
(Grupo de Fisica de Materiales Complejos, Universidad Complutense, 28040 Madrid, Spain)
,
Nellist Peter D.
(EPSRC SuperSTEM Facility, Daresbury Laboratory, Warrington WA4 4AD, UK)
,
Nellist Peter D.
(Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK)
資料名:
Ultramicroscopy
(Ultramicroscopy)
巻:
174
ページ:
27-34
発行年:
2017年
JST資料番号:
W0972A
ISSN:
0304-3991
CODEN:
ULTRD
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)