文献
J-GLOBAL ID:201802241412079813
整理番号:18A0521720
チャネルDRAMのためのチャネル共有可能組込み自己テスト方式【Powered by NICT】
A channel-sharable built-in self-test scheme for multi-channel DRAMs
著者 (6件):
Wu Kuan-Te
(Advanced Reliable Systems (ARES) Lab. Department of Electrical Engineering, National Central University, Taoyuan, Taiwan 320)
,
Li Jin-Fu
(Advanced Reliable Systems (ARES) Lab. Department of Electrical Engineering, National Central University, Taoyuan, Taiwan 320)
,
Lo Chih-Yen
(Information and Communication Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan 310)
,
Lai Jenn-Shiang
(Information and Communication Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan 310)
,
Kwai Ding-Ming
(Information and Communication Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan 310)
,
Chou Yung-Fa
(Information and Communication Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan 310)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2018
号:
ASP-DAC
ページ:
245-250
発行年:
2018年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)