文献
J-GLOBAL ID:201802242227439319
整理番号:18A0382016
ブラジルシンクロトロンにおける低エネルギーX線格子干渉測定【Powered by NICT】
Low energy X-ray grating interferometry at the Brazilian Synchrotron
著者 (11件):
Koch F.J.
(Institute of Microstructure Technology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany)
,
O’Dowd F.P.
(Brazilian Synchrotron Light Laboratory, 13083-970 Campinas, Brazil)
,
Cardoso M.B.
(Brazilian Synchrotron Light Laboratory, 13083-970 Campinas, Brazil)
,
Da Silva R.R.
(Institute of Chemistry - Sao Paulo State University - UNESP, CP 355, Araraquara, SP 14801-970, Brazil)
,
Cavicchioli M.
(Institute of Chemistry - Sao Paulo State University - UNESP, CP 355, Araraquara, SP 14801-970, Brazil)
,
Ribeiro S.J.L.
(Institute of Chemistry - Sao Paulo State University - UNESP, CP 355, Araraquara, SP 14801-970, Brazil)
,
Schroter T.J.
(Institute of Microstructure Technology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany)
,
Faisal A.
(Institute of Microstructure Technology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany)
,
Meyer P.
(Institute of Microstructure Technology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany)
,
Kunka D.
(Institute of Microstructure Technology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany)
,
Mohr J.
(Institute of Microstructure Technology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany)
資料名:
Optics Communications
(Optics Communications)
巻:
393
ページ:
195-198
発行年:
2017年
JST資料番号:
A0678B
ISSN:
0030-4018
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)