文献
J-GLOBAL ID:201802242733051190
整理番号:18A0518225
t-way試験生成戦略のためのクラッシュ回復支援の統合【Powered by NICT】
Integrating crash recovery support for t-way test generation strategy
著者 (4件):
Abdullah Syahrul Afzal Che
(Centre for Computer Engineering Studies, Faculty of Electrical Engineering, Universiti Teknologi MARA (UiTM), 40450 Shah Alam, Selangor, Malaysia)
,
Soh Zainal Hisham Che
(Centre for Computer Engineering Studies, Faculty of Electrical Engineering, Universiti Teknologi MARA (UiTM), 40450 Shah Alam, Selangor, Malaysia)
,
Shahbudin Shahrani
(Centre for Computer Engineering Studies, Faculty of Electrical Engineering, Universiti Teknologi MARA (UiTM), 40450 Shah Alam, Selangor, Malaysia)
,
Zamli Kamal Zuhairi
(Faculty of Computer Systems & Software Engineering, Universiti Malaysia Pahang (UMP), 26300 Gambang, Kuantan, Pahang, Malaysia)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
ICEESE
ページ:
17-20
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)