文献
J-GLOBAL ID:201802243732807768
整理番号:18A1028631
硬X線光電子分光法により測定した自然酸化物/BaSi_2および非晶質Si/BaSi_2界面におけるバンド整列【JST・京大機械翻訳】
Band alignments at native oxide/BaSi2 and amorphous-Si/BaSi2 interfaces measured by hard X-ray photoelectron spectroscopy
著者 (8件):
Takabe Ryota
(Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan)
,
Takeuchi Hiroki
(Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan)
,
Du Weijie
(Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan)
,
Ito Keita
(Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan)
,
Toko Kaoru
(Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan)
,
Ueda Shigenori
(Quantum Beam Unit, National Institute for Materials Science, Tsukuba, Ibaraki 305-0047, Japan)
,
Kimura Akio
(Graduate School of Science, Hiroshima University, Higashi-hiroshima 739-8526, Japan)
,
Suemasu Takashi
(Institute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
PVSC
ページ:
1-4
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)