文献
J-GLOBAL ID:201802245850265146
整理番号:18A0449572
多重指標アプローチを用いたBLSGにおける巻線間故障と状態同定【Powered by NICT】
Interturn fault and condition identification in BLSG using multiple indicator approach
著者 (7件):
Wang Danwei
(School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore)
,
Seshadrinath Jeevanand
(Rolls Royce @ NTU Corporate Lab, Nanyang Technological University, Singapore)
,
Nguyen VietHung
(School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore)
,
Ukil Abhisek
(School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore)
,
Jaiswal Vinay
(Rolls Royce @ NTU Corporate Lab, Nanyang Technological University, Singapore)
,
Vaiyapuri Viswanathan
(Advanced Technology Center, Rolls Royce Singapore Pte. Ltd., Singapore)
,
Nadarajan Sivakumar
(Advanced Technology Center, Rolls Royce Singapore Pte. Ltd., Singapore)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
PESGM
ページ:
1-5
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)