文献
J-GLOBAL ID:201802246959481223
整理番号:18A1712142
弱位相物体の単一高分解能透過電子顕微鏡画像からの出口波位相回復【JST・京大機械翻訳】
Exit-wave phase retrieval from a single high-resolution transmission electron microscopy image of a weak-phase object
著者 (10件):
Lin F.
(College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong, 510642, China)
,
Lin F.
(State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027, China)
,
Ren X.B.
(State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027, China)
,
Zhou W.P.
(College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong, 510642, China)
,
Zhang L.Y.
(College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong, 510642, China)
,
Xiao Y.
(College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong, 510642, China)
,
Zhang Q.
(College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong, 510642, China)
,
Xu H.T.
(College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong, 510642, China)
,
Li H.
(College of Electronic Engineering, South China Agricultural University, Guangzhou, Guangdong, 510642, China)
,
Jin C.H.
(State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou, 310027, China)
資料名:
Micron
(Micron)
巻:
114
ページ:
23-31
発行年:
2018年
JST資料番号:
E0318E
ISSN:
0968-4328
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)