文献
J-GLOBAL ID:201802248442776480
整理番号:18A0160949
ガラス/ガラス構造をもつn PERT両面シリコン太陽電池モジュールにおける電位誘導劣化の研究【Powered by NICT】
Investigation of Potential-Induced Degradation in n-PERT Bifacial Silicon Photovoltaic Modules with a Glass/Glass Structure
著者 (7件):
Luo Wei
(Solar Energy Research Institute of Singapore, Singapore)
,
Khoo Yong Sheng
(Solar Energy Research Institute of Singapore, Singapore)
,
Singh Jai Prakash
(Solar Energy Research Institute of Singapore, Singapore)
,
Wong Johnson Kai Chi
(Solar Energy Research Institute of Singapore, Singapore)
,
Wang Yan
(Solar Energy Research Institute of Singapore, Singapore)
,
Aberle Armin G.
(Solar Energy Research Institute of Singapore, Singapore)
,
Ramakrishna Seeram
(Solar Energy Research Institute of Singapore, Singapore)
資料名:
IEEE Journal of Photovoltaics
(IEEE Journal of Photovoltaics)
巻:
8
号:
1
ページ:
16-22
発行年:
2018年
JST資料番号:
W2305A
ISSN:
2156-3381
CODEN:
IJPEG8
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)