文献
J-GLOBAL ID:201802249635808123
整理番号:18A1302632
Xバンド試験台を用いたマイクロ波電力測定による誘電体材料の厚さの決定【JST・京大機械翻訳】
Determination of thickness oof dielectric material by microwave power measurement using X-band testbench
著者 (4件):
Islam Md A.
(Department of Electronics and Communication Engineering, Techno India College of Technology, Block-DG, Action Area 1, Newtown, Kolkata-700156, India)
,
Maiti M.
(Department of Electronics and Communication Engineering, Techno India College of Technology, Block-DG, Action Area 1, Newtown, Kolkata-700156, India)
,
Sil S.
(Department of Electronics and Communication Engineering, Techno India College of Technology, Block-DG, Action Area 1, Newtown, Kolkata-700156, India)
,
Sanyal J.
(Department of Electronics and Communication Engineering, Techno India College of Technology, Block-DG, Action Area 1, Newtown, Kolkata-700156, India)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2018
号:
EDCT
ページ:
1-4
発行年:
2018年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)