文献
J-GLOBAL ID:201802254601180297
整理番号:18A0507917
BEMDおよびPCAに基づく干渉イメージング分光計におけるDefringing【Powered by NICT】
Defringing in interference imaging spectrometer based on BEMD and PCA
著者 (8件):
Ren Wenyi
(School of Science, Northwest A&F University, Yangling 712100, China)
,
Wu Dan
(College of Mechanical and Electronic Engineering, Northwest A&F University, Yangling 712100, China)
,
Yang Guoan
(School of Electronic and Information Engineering, Xi’an Jiaotong University, Xi’an 710049, China)
,
Jiang Jiangang
(School of Science, Northwest A&F University, Yangling 712100, China)
,
Xie Yingge
(School of Science, Northwest A&F University, Yangling 712100, China)
,
Du Guangyuan
(School of Science, Northwest A&F University, Yangling 712100, China)
,
Wang Guodong
(School of Science, Northwest A&F University, Yangling 712100, China)
,
Zhang Sheqi
(School of Science, Northwest A&F University, Yangling 712100, China)
資料名:
Optik
(Optik)
巻:
157
ページ:
1027-1034
発行年:
2018年
JST資料番号:
D0251A
ISSN:
0030-4026
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)