文献
J-GLOBAL ID:201802254705916420
整理番号:18A1412258
高分解能X線光ルミネセンスにより研究したSiO2/ZnS膜の界面【JST・京大機械翻訳】
The interface of SiO2/ZnS films studied by high resolution X-ray photoluminescence
著者 (6件):
Shinjita Acharya
(DEPARTMENT OF MECHANICAL ENGINEERING,STANFORD UNIVERSITY,STANFORD,CA 94305,USA)
,
Orlando Trejo
(DEPARTMENT OF MECHANICAL ENGINEERING,STANFORD UNIVERSITY,STANFORD,CA 94305,USA)
,
Anup Dadlani
(DEPARTMENT OF CHEMISTRY,STANFORD UNIVERSITY,STANFORD,CA 94305,USA)
,
Jan Torgersen
(DEPARTMENT OF MECHANICAL ENGINEERING,STANFORD UNIVERSITY,STANFORD,CA 94305,USA;DEPARTMENT OF MECHANICAL AND INDUSTRIAL ENGINEERING,NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY,7034 TRONDHEIM,NORWAY)
,
Filippo Berto
(DEPARTMENT OF MECHANICAL AND INDUSTRIAL ENGINEERING,NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY,7034 TRONDHEIM,NORWAY)
,
Fritz Prinz
(DEPARTMENT OF MECHANICAL ENGINEERING,STANFORD UNIVERSITY,STANFORD,CA 94305,USA;DEPARTMENT OF MATERIALS SCIENCE AND ENGINEERING,STANFORD UNIVERSITY,STANFORD,CA 94305,USA)
資料名:
Lixue Kuaibao
(Lixue Kuaibao)
巻:
8
号:
1
ページ:
24-27
発行年:
2018年
JST資料番号:
C2867A
ISSN:
2095-0349
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
中国 (CHN)
言語:
英語 (EN)