文献
J-GLOBAL ID:201802255108156032
整理番号:18A0448588
手術下のヘリックス進行波管の遅波構造のための完全熱分析【Powered by NICT】
Full thermal analyses for slow-wave structure in helix-TWT under operation
著者 (10件):
Zhang Jin
(Research Center for Electronic Device & System Reliability, Southeast University Nanjing, China)
,
Yuan Huiyu
(Research Center for Electronic Device & System Reliability, Southeast University Nanjing, China)
,
Zhao Xingqun
(Research Center for Electronic Device & System Reliability, Southeast University Nanjing, China)
,
Bai Ningfeng
(Research Center for Electronic Device & System Reliability, Southeast University Nanjing, China)
,
Shen Changsheng
(Research Center for Electronic Device & System Reliability, Southeast University Nanjing, China)
,
Fan Hehong
(Research Center for Electronic Device & System Reliability, Southeast University Nanjing, China)
,
Sun Xiaohan
(Research Center for Electronic Device & System Reliability, Southeast University Nanjing, China)
,
Chen Bo
(Beijing Vacuum Electronics Research Institute, Beijing, China)
,
Feng Jinjun
(Beijing Vacuum Electronics Research Institute, Beijing, China)
,
Yan Tiechang
(Beijing Vacuum Electronics Research Institute, Beijing, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
IVEC
ページ:
1-2
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)