文献
J-GLOBAL ID:201802255142026555
整理番号:18A1028436
エミッタプロファイリングと太陽電池性能に及ぼす熱酸化プロセスの影響【JST・京大機械翻訳】
Effect of thermal oxidation process on emitter profiling and solar cell performance
著者 (7件):
Habib A.
(Technological Institute of Microelectronics (TiM), University of the Basque Country, Zamudio, Spain)
,
Fano V.
(Technological Institute of Microelectronics (TiM), University of the Basque Country, Zamudio, Spain)
,
Rasool M. A.
(Technological Institute of Microelectronics (TiM), University of the Basque Country, Zamudio, Spain)
,
Otaegi A.
(Technological Institute of Microelectronics (TiM), University of the Basque Country, Zamudio, Spain)
,
Gutierrez J. R.
(Technological Institute of Microelectronics (TiM), University of the Basque Country, Zamudio, Spain)
,
Jimeno J. C.
(Technological Institute of Microelectronics (TiM), University of the Basque Country, Zamudio, Spain)
,
Ahmed M.T.
(Faculty of Science, Department of Physics, Mansoura University, Mansoura, Egypt)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
PVSC
ページ:
1-4
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)