文献
J-GLOBAL ID:201802261451569618
整理番号:18A0968912
K_0.5Na_0.5NbO_3薄膜の相転移と圧電応答に及ぼす歪,温度,電場の影響【JST・京大機械翻訳】
Strain, temperature, and electric-field effects on the phase transition and piezoelectric responses of K0.5Na0.5NbO3 thin films
著者 (4件):
Zhou Meng-Jun
(School of Materials Science and Engineering, State Key Lab of New Ceramics and Fine Processing, Tsinghua University, Beijing 100084, China)
,
Wang Jian-Jun
(Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, USA)
,
Chen Long-Qing
(School of Materials Science and Engineering, State Key Lab of New Ceramics and Fine Processing, Tsinghua University, Beijing 100084, China)
,
Nan Ce-Wen
(School of Materials Science and Engineering, State Key Lab of New Ceramics and Fine Processing, Tsinghua University, Beijing 100084, China)
資料名:
Journal of Applied Physics
(Journal of Applied Physics)
巻:
123
号:
15
ページ:
154106-154106-6
発行年:
2018年
JST資料番号:
C0266A
ISSN:
0021-8979
CODEN:
JAPIAU
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)