文献
J-GLOBAL ID:201802262067372628
整理番号:18A0129762
高熱伝導薄膜基板系とそれらの界面熱抵抗のキャラクタリゼーション【Powered by NICT】
Characterisation of high thermal conductivity thin-film substrate systems and their interface thermal resistance
著者 (8件):
Moridi Alireza
(Laboratory for Precision and Nano Processing Technologies, School of Mechanical and Manufacturing, UNSW Australia, Kensington, NSW 2052, Australia)
,
Zhang Liangchi
(Laboratory for Precision and Nano Processing Technologies, School of Mechanical and Manufacturing, UNSW Australia, Kensington, NSW 2052, Australia)
,
Liu Weidong
(Laboratory for Precision and Nano Processing Technologies, School of Mechanical and Manufacturing, UNSW Australia, Kensington, NSW 2052, Australia)
,
Duvall Steven
(Silanna Semiconductor, 8 Herb Elliott Ave, Sydney Olympic Park, NSW 2127, Australia)
,
Brawley Andrew
(Silanna Semiconductor, 8 Herb Elliott Ave, Sydney Olympic Park, NSW 2127, Australia)
,
Jiang Zhuangde
(State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an 710049, China)
,
Yang Shuming
(State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an 710049, China)
,
Li Changsheng
(State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an 710049, China)
資料名:
Surface & Coatings Technology
(Surface & Coatings Technology)
巻:
334
ページ:
233-242
発行年:
2018年
JST資料番号:
D0205C
ISSN:
0257-8972
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)