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J-GLOBAL ID：201802264767216041
整理番号：18A1641575
ヨウ化鉛台形ナノプレートレットからの低しきい値Fabry-Perotモードレーザ発振【JST・京大機械翻訳】
Low Threshold Fabry-Perot Mode Lasing from Lead Iodide Trapezoidal Nanoplatelets
Zhong Yangguang
(Key Laboratory of Flexible Electronics and Institute of Advanced Materials, Jiangsu National Synergetic Innovation Center for Advanced Materials, Nanjing Tech University, 30 South Puzhu Road, Nanjing, 211816, China)
,
Zhong Yangguang
(Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, China)
,
Wei Qi
(Key Laboratory of Flexible Electronics and Institute of Advanced Materials, Jiangsu National Synergetic Innovation Center for Advanced Materials, Nanjing Tech University, 30 South Puzhu Road, Nanjing, 211816, China)
,
Wei Qi
(Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, China)
,
Liu Zhen
(Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, China)
,
Shang Qiuyu
(Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, China)
,
Shang Qiuyu
(Research Center for Wide Gap Semiconductor, Peking University, Beijing, 100871, China)
,
Zhao Liyun
(Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, China)
,
Shao Ruiwen
(Electron Microscopy Laboratory, School of Physics, Peking University, Beijing, 100871, China)
,
Zhang Zhepeng
(Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, China)
,
Zhang Zhepeng
(Center for Nanochemistry, Beijing National Laboratory for Molecular Sciences, College of Chemistry and Molecular Engineering, Academy for Advanced Interdisciplinary Studies, Beijing National Laboratory for Molecular Sciences, College of Chemistry and Molecular Engineering, Peking Universi...)
,
Chen Jie
(Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, China)
,
Chen Jie
(Division of Nanophotonics, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, 100190, China)
,
Du Wenna
(Division of Nanophotonics, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, 100190, China)
,
Shen Chao
(State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China)
,
Shen Chao
(College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing, 100049, China)
,
Zhang Jun
(State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China)
,
Zhang Jun
(College of Materials Science and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing, 100049, China)
,
Zhang Yanfeng
(Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, China)
,
Zhang Yanfeng
(Center for Nanochemistry, Beijing National Laboratory for Molecular Sciences, College of Chemistry and Molecular Engineering, Academy for Advanced Interdisciplinary Studies, Beijing National Laboratory for Molecular Sciences, College of Chemistry and Molecular Engineering, Peking Universi...)
,
Gao Peng
(Electron Microscopy Laboratory, School of Physics, Peking University, Beijing, 100871, China)
,
Gao Peng
(International Center for Quantum Materials, School of Physics, Peking University, Beijing, 100871, China)
,
Gao Peng
(Collaborative Innovation Center of Quantum Matter, Beijing, 100871, China)
,
Xing Guichuan
(Joint Key Laboratory of the Ministry of Education, Institute of Applied Physics and Materials Engineering, University of Macau, Avenida da Universidade, Taipa, Macao, SAR, 999078, China)
,
Liu Xinfeng
(Division of Nanophotonics, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing, 100190, China)
,
Zhang Qing
(Department of Materials Science and Engineering, College of Engineering, Peking University, Beijing, 100871, China)
,
Zhang Qing
(Research Center for Wide Gap Semiconductor, Peking University, Beijing, 100871, China)
資料名：
Small
(Small)
巻： 14 号： 35 ページ： e1801938 発行年： 2018年
JST資料番号： W2348A ISSN： 1613-6810 資料種別： 逐次刊行物 (A)
記事区分： 原著論文 発行国： ドイツ (DEU) 言語： 英語 (EN)
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