文献
J-GLOBAL ID:201802271517976873
整理番号:18A0385350
工業メガボルトX線イメージングシステムでのフラットパネルイメージャの性能定量化【Powered by NICT】
Performance quantification of a flat-panel imager in industrial mega-voltage X-ray imaging systems
著者 (5件):
Stritt Carina
(Empa, Swiss Federal Laboratories for Material Science and Technology, Center for X-ray Analytics, Ueberlandstrasse 129, 8600 Duebendorf, Switzerland)
,
Plamondon Mathieu
(Empa, Swiss Federal Laboratories for Material Science and Technology, Center for X-ray Analytics, Ueberlandstrasse 129, 8600 Duebendorf, Switzerland)
,
Hofmann Juergen
(Empa, Swiss Federal Laboratories for Material Science and Technology, Center for X-ray Analytics, Ueberlandstrasse 129, 8600 Duebendorf, Switzerland)
,
Flisch Alexander
(Empa, Swiss Federal Laboratories for Material Science and Technology, Center for X-ray Analytics, Ueberlandstrasse 129, 8600 Duebendorf, Switzerland)
,
Sennhauser Urs
(Empa, Swiss Federal Laboratories for Material Science and Technology, Reliability Science and Technology Laboratory, Ueberlandstrasse 129, 8600 Duebendorf, Switzerland)
資料名:
Nuclear Instruments & Methods in Physics Research. Section A. Accelerators, Spectrometers, Detectors and Associated Equipment
(Nuclear Instruments & Methods in Physics Research. Section A. Accelerators, Spectrometers, Detectors and Associated Equipment)
巻:
848
ページ:
73-80
発行年:
2017年
JST資料番号:
D0208B
ISSN:
0168-9002
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)