文献
J-GLOBAL ID:201802272070339068
整理番号:18A0587594
試験自動車計器盤のためのコスト効率の良いマイクロコントローラに基づくhardware-in-the-loop試験装置【Powered by NICT】
Cost-effective microcontroller-based hardware-in-the-loop test equipment for testing vehicle instrument panel
著者 (6件):
Jamaludin Wan Shahmisufi Wan
(School of Electrical and Electronic Engineering, Universiti Sains Malaysia Engineering Campus, Universiti Sains Malaysia, 14300, Nibong Tebal, Pulau Pinang)
,
Ren Tan Wei
(School of Electrical and Electronic Engineering, Universiti Sains Malaysia Engineering Campus, Universiti Sains Malaysia, 14300, Nibong Tebal, Pulau Pinang)
,
Rosdi Bakhtiar Affendi
(School of Electrical and Electronic Engineering, Universiti Sains Malaysia Engineering Campus, Universiti Sains Malaysia, 14300, Nibong Tebal, Pulau Pinang)
,
Ishak Dahaman
(School of Electrical and Electronic Engineering, Universiti Sains Malaysia Engineering Campus, Universiti Sains Malaysia, 14300, Nibong Tebal, Pulau Pinang)
,
bin Hanafi Noor Hafizi
(Continental Automotive Components Malaysia Sdn. Bhd. MK 1, 2455, Tingkat Perusahaan 2A, Prai Industrial Estate, 13600 Perai, Pulau Pinang, Malaysia)
,
Mahyuddin Muhammad Nasiruddin
(School of Electrical and Electronic Engineering, Universiti Sains Malaysia Engineering Campus, Universiti Sains Malaysia, 14300, Nibong Tebal, Pulau Pinang)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
ICSIMA
ページ:
1-6
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)