文献
J-GLOBAL ID:201802274273980676
整理番号:18A0391065
パルスサーモグラフィー検査のための非線形システム同定に基づく新しい欠陥深さ測定法【Powered by NICT】
A novel defect depth measurement method based on Nonlinear System Identification for pulsed thermographic inspection
著者 (4件):
Zhao Yifan
(The EPSRC Centre for Innovative Manufacturing in Through-life Engineering Services, Cranfield Manufacturing, Cranfield University, Cranfield MK43 0AL, UK)
,
Mehnen Jorn
(The EPSRC Centre for Innovative Manufacturing in Through-life Engineering Services, Cranfield Manufacturing, Cranfield University, Cranfield MK43 0AL, UK)
,
Sirikham Adisorn
(The EPSRC Centre for Innovative Manufacturing in Through-life Engineering Services, Cranfield Manufacturing, Cranfield University, Cranfield MK43 0AL, UK)
,
Roy Rajkumar
(The EPSRC Centre for Innovative Manufacturing in Through-life Engineering Services, Cranfield Manufacturing, Cranfield University, Cranfield MK43 0AL, UK)
資料名:
Mechanical Systems and Signal Processing
(Mechanical Systems and Signal Processing)
巻:
85
ページ:
382-395
発行年:
2017年
JST資料番号:
T0514A
ISSN:
0888-3270
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)