文献
J-GLOBAL ID:201802274997302618
整理番号:18A0520403
α-μ/κ-μおよびκ-μ/α-μフェージングシナリオのための瞬断率解析【Powered by NICT】
Outage probability analysis for α-μ/κ-μ and κ-μ/α-μ fading scenarios
著者 (6件):
Bhargav Nidhi
(School of Electronics, Electrical Engineering and Computer Science, Queen’s University Belfast, BT3 9DT, Belfast, UK)
,
Simmons David E.
(Department of Engineering Science, University of Oxford, OX1 3PJ Oxford, UK)
,
Nogueira da Silva Carlos Rafael
(School of Electrical and Computer Engineering, University of Campinas, Campinas 13083-970, Brazil)
,
Leonardo Elvio Joao
(The Department of Informatics, State University of Maringa, 87020-900 Maringa, Brazil)
,
Cotton Simon L.
(School of Electronics, Electrical Engineering and Computer Science, Queen’s University Belfast, BT3 9DT, Belfast, UK)
,
Daoud Yacoub Michel
(School of Electrical and Computer Engineering, University of Campinas, Campinas 13083-970, Brazil)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
PIMRC
ページ:
1-5
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)