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J-GLOBAL ID:201802276506185538
整理番号:18A0588507
Blackghost1.0テストチップ:モノのインターネットのための超低Vdd SoCの商業化への道【Powered by NICT】
Blackghost 1.0 test chip: On the road towards commercializing ultra-low-Vdd SoC for Internet-of-Things
著者 (7件):
Pu Yu
(Qualcomm Research, Qualcomm Incorporated, 5775 Morehouse Drive, San Diego, California, CA 92121, U.S.A)
,
Easton Ken
(Qualcomm Research, Qualcomm Incorporated, 5775 Morehouse Drive, San Diego, California, CA 92121, U.S.A)
,
Shi Chunlei
(Qualcomm Research, Qualcomm Incorporated, 5775 Morehouse Drive, San Diego, California, CA 92121, U.S.A)
,
Beraha Rudy
(Qualcomm Research, Qualcomm Incorporated, 5775 Morehouse Drive, San Diego, California, CA 92121, U.S.A)
,
Newham Adam
(Qualcomm Research, Qualcomm Incorporated, 5775 Morehouse Drive, San Diego, California, CA 92121, U.S.A)
,
Attar Rashid
(Qualcomm Research, Qualcomm Incorporated, 5775 Morehouse Drive, San Diego, California, CA 92121, U.S.A)
,
Du Yang
(Qualcomm Research, Qualcomm Incorporated, 5775 Morehouse Drive, San Diego, California, CA 92121, U.S.A)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
S3S
ページ:
1-2
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)