文献
J-GLOBAL ID:201802279538343492
整理番号:18A0149893
神経冠の欠損によるCHARGEd【Powered by NICT】
CHARGEd with neural crest defects
著者 (3件):
Pauli Silke
(Institute of Human Genetics, University Medical Center Gottingen, Gottingen, Germany)
,
Bajpai Ruchi
(Center for Craniofacial Molecular Biology, Ostrow School of Dentistry and Department of Biochemistry and Molecular Biology, Keck School of Medicine, University of Southern California, Los Angeles, California)
,
Borchers Annette
(Department of Biology, Molecular Embryology, Philipps-University Marburg, Marburg, Germany)
資料名:
American Journal of Medical Genetics. Part C. Seminars in Medical Genetics
(American Journal of Medical Genetics. Part C. Seminars in Medical Genetics)
巻:
175
号:
4
ページ:
478-486
発行年:
2017年
JST資料番号:
A1123A
ISSN:
1552-4868
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)