文献
J-GLOBAL ID:201802279841782069
整理番号:18A1998460
その場X線シンクロトロンに基づくマイクロ断層撮影によるAA7050中の構成粒子の亀裂による疲れ亀裂偏向の測定【JST・京大機械翻訳】
Measuring fatigue crack deflections via cracking of constituent particles in AA7050 via in situ x-ray synchrotron-based micro-tomography
著者 (6件):
Carter Stephen T.
(School of Aeronautics and Astronautics, Purdue University, 701 W. Stadium Ave, West Lafayette, IN 47907-2045, USA)
,
Rotella John
(School of Materials Engineering, Purdue University 701 W. Stadium Ave, West Lafayette, IN 47907-2045, USA)
,
Agyei Ronald F.
(School of Aeronautics and Astronautics, Purdue University, 701 W. Stadium Ave, West Lafayette, IN 47907-2045, USA)
,
Xiao Xiaghui
(Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, IL 60439-4837, USA)
,
Sangid Michael D.
(School of Aeronautics and Astronautics, Purdue University, 701 W. Stadium Ave, West Lafayette, IN 47907-2045, USA)
,
Sangid Michael D.
(School of Materials Engineering, Purdue University 701 W. Stadium Ave, West Lafayette, IN 47907-2045, USA)
資料名:
International Journal of Fatigue
(International Journal of Fatigue)
巻:
116
ページ:
490-504
発行年:
2018年
JST資料番号:
D0802B
ISSN:
0142-1123
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)