文献
J-GLOBAL ID:201802279935634907
整理番号:18A1212429
長期劣化とサイクリングの下でのボードレベル熱試験におけるENIGとENEPIG表面仕上げのパッケージング信頼性効果【JST・京大機械翻訳】
Packaging Reliability Effect of ENIG and ENEPIG Surface Finishes in Board Level Thermal Test under Long-Term Aging and Cycling
著者 (7件):
Shen Chaobo
(Center for Advanced Vehicle and Extreme Environment Electronics (CAVE3), Auburn University, Auburn, AL 36849, USA)
,
Hai Zhou
(Center for Advanced Vehicle and Extreme Environment Electronics (CAVE3), Auburn University, Auburn, AL 36849, USA)
,
Zhao Cong
(Center for Advanced Vehicle and Extreme Environment Electronics (CAVE3), Auburn University, Auburn, AL 36849, USA)
,
Zhang Jiawei
(Center for Advanced Vehicle and Extreme Environment Electronics (CAVE3), Auburn University, Auburn, AL 36849, USA)
,
Evans John L.
(Center for Advanced Vehicle and Extreme Environment Electronics (CAVE3), Auburn University, Auburn, AL 36849, USA)
,
Bozack Michael J.
(Center for Advanced Vehicle and Extreme Environment Electronics (CAVE3), Auburn University, Auburn, AL 36849, USA)
,
Suhling Jeffrey C.
(Center for Advanced Vehicle and Extreme Environment Electronics (CAVE3), Auburn University, Auburn, AL 36849, USA)
資料名:
Materials (Web)
(Materials (Web))
巻:
10
号:
5
ページ:
451
発行年:
2017年
JST資料番号:
U7237A
ISSN:
1996-1944
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
スイス (CHE)
言語:
英語 (EN)