文献
J-GLOBAL ID:201802279993371029
整理番号:18A0281761
HIRFLでの25MeV/uの~86Krイオンマイクロビームを用いたデバイス構造の解析のためのSEUイメージングの応用【Powered by NICT】
Application of SEU imaging for analysis of device architecture using a 25MeV/u 86Kr ion microbeam at HIRFL
著者 (16件):
Liu Tianqi
(Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China)
,
Liu Tianqi
(School of Physical Science and Technology, Lanzhou University, Lanzhou 730000, China)
,
Liu Tianqi
(University of Chinese Academy of Sciences, Beijing 100049, China)
,
Yang Zhenlei
(Technology and Engineering Center for Space Utilization, Chinese Academy of Sciences, Beijing 100094, China)
,
Guo Jinlong
(Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China)
,
Du Guanghua
(Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China)
,
Tong Teng
(Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China)
,
Wang Xiaohui
(Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China)
,
Su Hong
(Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China)
,
Liu Wenjing
(Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China)
,
Liu Jiande
(Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China)
,
Wang Bin
(Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China)
,
Wang Bin
(University of Chinese Academy of Sciences, Beijing 100049, China)
,
Ye Bing
(Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China)
,
Ye Bing
(University of Chinese Academy of Sciences, Beijing 100049, China)
,
Liu Jie
(Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China)
資料名:
Nuclear Instruments & Methods in Physics Research. Section B. Beam Interactions with Materials and Atoms
(Nuclear Instruments & Methods in Physics Research. Section B. Beam Interactions with Materials and Atoms)
巻:
404
ページ:
254-258
発行年:
2017年
JST資料番号:
H0899A
ISSN:
0168-583X
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)