文献
J-GLOBAL ID:201802280440377638
整理番号:18A0477307
制御可能な利得を持つペロブスカイト型光検出器におけるトラップされた電子誘起正孔注入【Powered by NICT】
Trapped-Electron-Induced Hole Injection in Perovskite Photodetector with Controllable Gain
著者 (8件):
Zhang Dezhong
(State Key Laboratory on Integrated Optoelectronics, Jilin University, Changchun, 130012, P. R. China)
,
Liu Chunyu
(State Key Laboratory on Integrated Optoelectronics, Jilin University, Changchun, 130012, P. R. China)
,
Li Kanzhe
(College of Electronic Science and Engineering, Jilin University, Changchun, 130012, P. R. China)
,
Guo Wenbin
(College of Electronic Science and Engineering, Jilin University, Changchun, 130012, P. R. China)
,
Gao Fengli
(College of Electronic Science and Engineering, Jilin University, Changchun, 130012, P. R. China)
,
Zhou Jingran
(State Key Laboratory on Integrated Optoelectronics, Jilin University, Changchun, 130012, P. R. China)
,
Zhang Xindong
(College of Electronic Science and Engineering, Jilin University, Changchun, 130012, P. R. China)
,
Ruan Shengping
(State Key Laboratory on Integrated Optoelectronics, Jilin University, Changchun, 130012, P. R. China)
資料名:
Advanced Optical Materials
(Advanced Optical Materials)
巻:
6
号:
4
ページ:
ROMBUNNO.201701189
発行年:
2018年
JST資料番号:
W2486A
ISSN:
2195-1071
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)