文献
J-GLOBAL ID:201802280581449053
整理番号:18A0438538
任意温度での発光ダイオードの内部量子効率の測定【Powered by NICT】
Measuring the Internal Quantum Efficiency of Light-Emitting Diodes at an Arbitrary Temperature
著者 (5件):
Shim Jong-In
(Department of Electronics and Communication Engineering, ERICA Campus, Hanyang University, Ansan, South Korea)
,
Han Dong-Pyo
(Faculty of Science and Technology, Meijo University, Nagoya, Japan)
,
Oh Chan-Hyoung
(Department of Electronics and Communication Engineering, ERICA Campus, Hanyang University, Ansan, South Korea)
,
Jung Hyundon
(EtaMax Co., Ltd., Suwon, South Korea)
,
Shin Dong-Soo
(Department of Photonics and Nanoelectronics and the Department of Bionanotechnology, ERICA Campus, Hanyang University, Ansan, South Korea)
資料名:
IEEE Journal of Quantum Electronics
(IEEE Journal of Quantum Electronics)
巻:
54
号:
2
ページ:
ROMBUNNO.8000106.1-6
発行年:
2018年
JST資料番号:
H0432A
ISSN:
0018-9197
CODEN:
IEJQA7
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)