文献
J-GLOBAL ID:201802280854218848
整理番号:18A0526095
Si及びGaAs中のAuger電子分光法によるFermi準位シフトの検出【Powered by NICT】
Detecting Fermi-level shifts by Auger electron spectroscopy in Si and GaAs
著者 (9件):
Debehets J.
(Department of Materials Engineering, KU Leuven, Kasteelpark Arenberg 44 box 2450, 3001 Heverlee, Belgium)
,
Homm P.
(Department of Physics and Astronomy, KU Leuven, Celestijnenlaan 200D, 3001 Heverlee, Belgium)
,
Menghini M.
(Department of Physics and Astronomy, KU Leuven, Celestijnenlaan 200D, 3001 Heverlee, Belgium)
,
Chambers S.A.
(Physical and Computational Sciences Directorate, Pacific Northwest National Laboratory, Richland, USA)
,
Marchiori C.
(IBM Research Zuerich, Saeumerstrasse 4, 8830 Rueschlikon, Switzerland)
,
Heyns M.
(Department of Materials Engineering, KU Leuven, Kasteelpark Arenberg 44 box 2450, 3001 Heverlee, Belgium)
,
Heyns M.
(IMEC vzw, Kapeldreef 75, 3001 Heverlee, Belgium)
,
Locquet J.P.
(Department of Physics and Astronomy, KU Leuven, Celestijnenlaan 200D, 3001 Heverlee, Belgium)
,
Seo J.W.
(Department of Materials Engineering, KU Leuven, Kasteelpark Arenberg 44 box 2450, 3001 Heverlee, Belgium)
資料名:
Applied Surface Science
(Applied Surface Science)
巻:
440
ページ:
386-395
発行年:
2018年
JST資料番号:
B0707B
ISSN:
0169-4332
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)