文献
J-GLOBAL ID:201802281126936663
整理番号:18A0484003
平坦スペクトル応答X線ダイオード上の金光電陰極汚染の影響【Powered by NICT】
Effect of gold photocathode contamination on a flat spectral response X-ray diode
著者 (7件):
Wang Kun-lun
(Key laboratory of Pulsed power IFP CAEP, Mianyang 621900, China)
,
Zhang Si-qun
(Key laboratory of Pulsed power IFP CAEP, Mianyang 621900, China)
,
Zhou Shao-tong
(Key laboratory of Pulsed power IFP CAEP, Mianyang 621900, China)
,
Huang Xian-bin
(Key laboratory of Pulsed power IFP CAEP, Mianyang 621900, China)
,
Ren Xiao-dong
(Key laboratory of Pulsed power IFP CAEP, Mianyang 621900, China)
,
Dan Jia-kun
(Key laboratory of Pulsed power IFP CAEP, Mianyang 621900, China)
,
Xu Qiang
(Key laboratory of Pulsed power IFP CAEP, Mianyang 621900, China)
資料名:
Nuclear Instruments & Methods in Physics Research. Section A. Accelerators, Spectrometers, Detectors and Associated Equipment
(Nuclear Instruments & Methods in Physics Research. Section A. Accelerators, Spectrometers, Detectors and Associated Equipment)
巻:
884
ページ:
75-81
発行年:
2018年
JST資料番号:
D0208B
ISSN:
0168-9002
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)