文献
J-GLOBAL ID:201802283579589029
整理番号:18A0163509
低温硬化型ポジ型感光性誘電体材料のための高い信頼性【Powered by NICT】
Higher reliability for low-temperature curable positive-tone photosensitive dielectric materials
著者 (8件):
Shoji Yu
(Electronic & Imaging Materials Research Laboratories, Toray Industries, Inc., Shiga, Japan)
,
Araki Hitoshi
(Electronic & Imaging Materials Research Laboratories, Toray Industries, Inc., Shiga, Japan)
,
Koyama Yutaro
(Electronic & Imaging Materials Research Laboratories, Toray Industries, Inc., Shiga, Japan)
,
Masuda Yuki
(Electronic & Imaging Materials Research Laboratories, Toray Industries, Inc., Shiga, Japan)
,
Hashimoto Keika
(Electronic & Imaging Materials Research Laboratories, Toray Industries, Inc., Shiga, Japan)
,
Isobe Kimio
(Electronic & Imaging Materials Research Laboratories, Toray Industries, Inc., Shiga, Japan)
,
Okuda Ryoji
(Electronic & Imaging Materials Research Laboratories, Toray Industries, Inc., Shiga, Japan)
,
Tomikawa Masao
(Electronic & Imaging Materials Research Laboratories, Toray Industries, Inc., Shiga, Japan)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
ICSJ
ページ:
103-106
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)