文献
J-GLOBAL ID:201802283933004309
整理番号:18A0848504
低価格マイクロコントローラを用いたマルチセルリチウムイオン電池のための異常値マイニングに基づく故障診断【JST・京大機械翻訳】
Outlier mining-based fault diagnosis for multiceli lithium-ion batteries using a low-priced microcontroller
著者 (7件):
Kim Taesic
(Electrical Engineering and Computer Science, Texas A&M University-Kingsville, Kingsville, TX 78363-8202 USA)
,
Adhikaree Amit
(Electrical Engineering and Computer Science, Texas A&M University-Kingsville, Kingsville, TX 78363-8202 USA)
,
Pandey Rajendra
(Electrical Engineering and Computer Science, Texas A&M University-Kingsville, Kingsville, TX 78363-8202 USA)
,
Kang Daewook
(Power Conversion and Control Research Center, Korea Electrotechnology Research Institute, Changwon, 51543 South Korea)
,
Kim Myoungho
(Power Conversion and Control Research Center, Korea Electrotechnology Research Institute, Changwon, 51543 South Korea)
,
Oh Chang-Yeol
(Power Conversion and Control Research Center, Korea Electrotechnology Research Institute, Changwon, 51543 South Korea)
,
Back Juwon
(Power Conversion and Control Research Center, Korea Electrotechnology Research Institute, Changwon, 51543 South Korea)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2018
号:
APEC
ページ:
3365-3369
発行年:
2018年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)