文献
J-GLOBAL ID:201802286401787727
整理番号:18A0536097
数学的形態学とBayesセグメンテーションに基づく絶縁体認識【Powered by NICT】
Insulator recognition based on mathematical morphology and Bayesian segmentation
著者 (5件):
Xia Fei
(College of Automation Engineering, Shanghai University of Electric Power, Shanghai, China)
,
Tie Hai-feng
(ShangHai Green Motive Technology Ltd, Shanghai, China)
,
Shi En-wei
(College of Automation Engineering, Shanghai University of Electric Power, Shanghai, China)
,
Zhang Qian
(Department of Electronics, University of York, York, UK)
,
Wang Lei
(College of Electric Engineering, Shanghai University of Electric Power, Shanghai, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
CISP-BMEI
ページ:
1-5
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)