文献
J-GLOBAL ID:201802289944956078
整理番号:18A1899163
電子および正孔電流を別々に測定することによるIGBTにおける注入増強効果の検証【JST・京大機械翻訳】
Verification of the Injection Enhancement Effect in IGBTs by Measuring the Electron and Hole Currents Separately
著者 (18件):
Hoshii T.
(Tokyo Institute of Technology, Yokohama, Japan)
,
Furukawa K.
(Tokyo Institute of Technology, Yokohama, Japan)
,
Kakushima K.
(Tokyo Institute of Technology, Yokohama, Japan)
,
Watanabe M.
(Tokyo Institute of Technology, Yokohama, Japan)
,
Shigvo N.
(Tokyo Institute of Technology, Yokohama, Japan)
,
Saraya T.
(Tokyo Institute of Technology, Yokohama, Japan)
,
Takakura T.
(The Universitv of Tokvo, Tokvo, Janan)
,
Ltou K.
(The Universitv of Tokvo, Tokvo, Janan)
,
Fukui M.
(The Universitv of Tokvo, Tokvo, Janan)
,
Suzuki S.
(The Universitv of Tokvo, Tokvo, Janan)
,
Takeuchi K.
(The Universitv of Tokvo, Tokvo, Janan)
,
Muneta I.
(Tokyo Institute of Technology, Yokohama, Japan)
,
Wakabayashi H.
(Tokyo Institute of Technology, Yokohama, Japan)
,
Nishizawa S.
(Kyushu University, Fukuoka, Japan)
,
Tsutsui K.
(The Universitv of Tokvo, Tokvo, Janan)
,
Hiramoto T.
(The Universitv of Tokvo, Tokvo, Janan)
,
Ohashi H.
(Tokyo Institute of Technology, Yokohama, Japan)
,
Lwai H.
(Tokyo Institute of Technology, Yokohama, Japan)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2018
号:
ESSDERC
ページ:
26-29
発行年:
2018年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)