文献
J-GLOBAL ID:201802291063441136
整理番号:18A0384979
22nmバルクnFinFETにおける総電離線量の三次元有限要素法シミュレーション【Powered by NICT】
Three-dimensional Finite Elements Method simulation of Total Ionizing Dose in 22nm bulk nFinFETs
著者 (4件):
Chatzikyriakou Eleni
(Department of Electrical and Computer Science, University of Southampton, United Kingdom)
,
Potter Kenneth
(Department of Electrical and Computer Science, University of Southampton, United Kingdom)
,
Redman-White William
(Department of Electrical and Computer Science, University of Southampton, United Kingdom)
,
De Groot C.H.
(Department of Electrical and Computer Science, University of Southampton, United Kingdom)
資料名:
Nuclear Instruments & Methods in Physics Research. Section B. Beam Interactions with Materials and Atoms
(Nuclear Instruments & Methods in Physics Research. Section B. Beam Interactions with Materials and Atoms)
巻:
393
ページ:
39-43
発行年:
2017年
JST資料番号:
H0899A
ISSN:
0168-583X
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)