文献
J-GLOBAL ID:201902223765134569
整理番号:19A1415749
Ge_2Sb_2Te_5薄膜の高温電気抵抗率とSEebeck係数【JST・京大機械翻訳】
High temperature electrical resistivity and Seebeck coefficient of Ge2Sb2Te5 thin films
著者 (9件):
Adnane L.
(Department of Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA)
,
Dirisaglik F.
(Department of Electrical and Electronics Engineering, Eskisehir Osmangazi University, Eskisehir 26480, Turkey)
,
Cywar A.
(Department of Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA)
,
Cil K.
(Department of Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA)
,
Zhu Y.
(IBM Watson Research Center, Yorktown Heights, New York 10598, USA)
,
Lam C.
(IBM Watson Research Center, Yorktown Heights, New York 10598, USA)
,
Anwar A. F. M.
(Department of Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA)
,
Gokirmak A.
(Department of Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA)
,
Silva H.
(Department of Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA)
資料名:
Journal of Applied Physics
(Journal of Applied Physics)
巻:
122
号:
12
ページ:
125104-125104-9
発行年:
2017年
JST資料番号:
C0266A
ISSN:
0021-8979
CODEN:
JAPIAU
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)